Computational Technology Resources - CCC

G. Vallet García, S. Gregori, M. Tur, F.J. Fuenmayor, J. Gil, A.M. Pedrosa, "Influence of Support Height Assembly Errors on the Pantograph-OCR Contact Force", in J. Pombo, (Editor), "Proceedings of the Seventh International Conference on Railway Technology: Research, Development and Maintenance ", Civil-Comp Press, Edinburgh, UK, Online volume: CCC 15, Paper 10.9, 2026, doi:10.4203/ccc.15.10.9

Keywords: overhead conductor rail, rigid catenary, dynamic interaction, assembly errors, pantograph, contact force.

Abstract

In this work, the influence of assembly errors on the pantograph–rigid catenary interaction is explored. First, a finite element model of a rigid catenary is proposed, consisting mainly of beam elements and point stiffnesses to represent the supports. A straight catenary section is considered, whose nominal geometry is characterised by uniformly spaced supports mounted at the same height. Several simulations are then performed in which the supports are mounted at different heights, simulating installation errors. As a result, the probability density function of key indicators, such as the maximum, minimum, and standard deviation of the contact force, is obtained for different magnitudes of the maximum installation error allowed. All these indicators show a deterioration compared to their values in the nominal case. This work enables the determination of an assembly error tolerance range within which the contact quality remains within acceptable limits.

download the full-text of this paper (PDF, 10 pages, 769 Kb)

go to the previous paper
go to the next paper
return to the table of contents
return to the volume description

	Computational & Technology Resources an online resource for computational, engineering & technology publications
	not logged in - login
Front Page Browse CCC CCP CSETS CTR IJRT Other Authors Search Purchase Guide FAQ Contact us	Civil-Comp Conferences ISSN 2753-3239 CCC: 15 PROCEEDINGS OF THE SEVENTH INTERNATIONAL CONFERENCE ON RAILWAY TECHNOLOGY: RESEARCH, DEVELOPMENT AND MAINTENANCE Edited by: J. Pombo Paper 10.9 Influence of Support Height Assembly Errors on the Pantograph-OCR Contact Force G. Vallet García, S. Gregori, M. Tur, F.J. Fuenmayor, J. Gil and A.M. Pedrosa , Universitat Politècnica de València, Valencia, Spain doi:10.4203/ccc.15.10.9 Full Bibliographic Reference for this paper G. Vallet García, S. Gregori, M. Tur, F.J. Fuenmayor, J. Gil, A.M. Pedrosa, "Influence of Support Height Assembly Errors on the Pantograph-OCR Contact Force", in J. Pombo, (Editor), "Proceedings of the Seventh International Conference on Railway Technology: Research, Development and Maintenance ", Civil-Comp Press, Edinburgh, UK, Online volume: CCC 15, Paper 10.9, 2026, doi:10.4203/ccc.15.10.9 Keywords: overhead conductor rail, rigid catenary, dynamic interaction, assembly errors, pantograph, contact force. Abstract In this work, the influence of assembly errors on the pantograph–rigid catenary interaction is explored. First, a finite element model of a rigid catenary is proposed, consisting mainly of beam elements and point stiffnesses to represent the supports. A straight catenary section is considered, whose nominal geometry is characterised by uniformly spaced supports mounted at the same height. Several simulations are then performed in which the supports are mounted at different heights, simulating installation errors. As a result, the probability density function of key indicators, such as the maximum, minimum, and standard deviation of the contact force, is obtained for different magnitudes of the maximum installation error allowed. All these indicators show a deterioration compared to their values in the nominal case. This work enables the determination of an assembly error tolerance range within which the contact quality remains within acceptable limits. download the full-text of this paper (PDF, 10 pages, 769 Kb) go to the previous paper go to the next paper return to the table of contents return to the volume description
Back to top	©Civil-Comp Limited 2023 - terms & conditions